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Volumn 22, Issue 5, 2003, Pages 1132-1144

Stabilized bis-ylides as a source of carbene ligands in palladium(II) and platinum(II) complexes

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; COMPLEXATION; CRYSTAL STRUCTURE; DECOMPOSITION; X RAY DIFFRACTION;

EID: 0037416394     PISSN: 02767333     EISSN: None     Source Type: Journal    
DOI: 10.1021/om020467d     Document Type: Article
Times cited : (23)

References (105)
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    • Griffith, E. J., Grayson, M., Eds.; Interscience Publishers: John Wiley and Sons: New York
    • (a) Shaw, M. A.; Ward, R. S. In Topics in Phosphorus Chemistry; Griffith, E. J., Grayson, M., Eds.; Interscience Publishers: John Wiley and Sons: New York, 1972; Vol. 7, pp 1-32.
    • (1972) Topics in Phosphorus Chemistry , vol.7 , pp. 1-32
    • Shaw, M.A.1    Ward, R.S.2
  • 50
    • 0000242516 scopus 로고    scopus 로고
    • Related examples
    • Related examples: (d) Allen, A.; Lin, W. Organometallics 1999, 18, 2922.
    • (1999) Organometallics , vol.18 , pp. 2922
    • Allen, A.1    Lin, W.2
  • 61
    • 0001362592 scopus 로고
    • Abel, E. W., Stone, F. G. A., Wilkinson, G., Editors-in-chief; Pergamon Press: Oxford, ff
    • (a) Hartley, F. R. In Comprehensive Organometallic Chemistry I; Abel, E. W., Stone, F. G. A., Wilkinson, G., Editors-in-chief; Pergamon Press: Oxford, 1982. Vol. 6, p 502 and ff.
    • (1982) Comprehensive Organometallic Chemistry I , vol.6 , pp. 502
    • Hartley, F.R.1
  • 102
    • 0003493386 scopus 로고
    • Bruker Analytical X-ray Systems: Madison, WI
    • SAINT Version 5.0; Bruker Analytical X-ray Systems: Madison, WI, 1995.
    • (1995) SAINT Version 5.0
  • 105
    • 0004150157 scopus 로고    scopus 로고
    • Göttingen University, Molecular graphics were done using the commercial package SHELXTL-PLUS, Release 5.05/V; Siemens Analytical X-ray Instruments, Inc.: Madison, WI
    • Sheldrick, G. M. SHELXL-97: FORTRAN program for the refinement of crystal structures from diffraction data; Göttingen University, 1997. Molecular graphics were done using the commercial package SHELXTL-PLUS, Release 5.05/V; Siemens Analytical X-ray Instruments, Inc.: Madison, WI, 1996.
    • (1996) SHELXL-97: FORTRAN Program for the Refinement of Crystal Structures from Diffraction Data
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.