Retrieved optical properties of thin films on absorbing substrates from transmittance measurements by application of a spectral projected gradient method

Thin Solid Films

Volumn 425, Issue 1-2, 2003, Pages 1-8

  Vargas, W E ^a   Azofeifa, D E ^a   Clark, N ^a  

^a UNIVERSIDAD DE COSTA RICA   (Costa Rica)

Author keywords

Evaporation; Optical coatings; Optical properties; Palladium

Indexed keywords

EVAPORATION; OPACITY; OPTICAL COATINGS; PALLADIUM; PROJECTION SYSTEMS; REFRACTIVE INDEX; SPECTRUM ANALYSIS; THICKNESS MEASUREMENT;

SPECTRAL PROJECTED GRADIENT METHOD (SPGM);

THIN FILMS;

EID: 0037415945     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)01117-3     Document Type: Article

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