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Volumn 358, Issue 1, 2000, Pages 166-171
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Simple method for determining the optical constants of thin metallic films from transmittance measurements
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Author keywords
[No Author keywords available]
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Indexed keywords
LIGHT ABSORPTION;
LIGHT REFRACTION;
LIGHT TRANSMISSION;
MATHEMATICAL MODELS;
METALLIC FILMS;
OPTICAL VARIABLES MEASUREMENT;
SUBSTRATES;
THIN FILMS;
TRANSPARENCY;
TUNGSTEN COMPOUNDS;
OPTICAL CONSTANTS;
TUNGSTEN OXIDE;
OPTICAL COATINGS;
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EID: 0033883339
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(99)00689-6 Document Type: Article |
Times cited : (21)
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References (14)
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