Study of optical constants of films used for the synthesis of broad-band antireflection coatings

Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

Volumn 82, Issue 4, 1997, Pages 603-609

  Kotlikov, E N ^a   Tereshchenko, G V ^a  

^a SAINT PETERSBURG STATE UNIVERSITY OF AEROSPACE INSTRUMENTATION   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0013415111     PISSN: 0030400X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (15)

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8. Valeev, A.S., Opt. Spekirosk., 1963, vol. 15, no. 4, pp. 500-511.
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11. Thun, R.E., Structure of Thin Films, in Physics of Thin Films, New York: Academic, 1963, vol. I. Translated under the title Fizika tonkikh plenok, Moscow: Mir, 1967, vol. 1.
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13. Voronkova, E.M., Grechushnikov, B.N., et al., Opticheskie materialy dlya infrakrasnoi tekniki: Spravochnoe izdanie (Handbook of Optical Materials for IR Instruments), Moscow: Nauka, 1965.
14. Infrared Laser Components and Accessories: Oriel Catalog, Darmstadt: LOT, 1975.
15. Borisevich, N.A., Vereshchagin, V.G., and Validov, M.A., Infrakrasnye fil'try (IR Filters), Minsk: Nauka i Tekhnika, 1971.