Laser diode light efficiency determination by thermoreflectance microscopy

Microelectronics Journal

Volumn 32, Issue 10-11, 2001, Pages 899-901

  Dilhaire, Stefan ^a   Jorez, Sebastien ^a   Patiño Lopez, Luis David ^a   Claeys, Wilfrid ^a   Schaub, Emmanuel ^b  

^a UNIVERSITÉ DE BORDEAUX   (France)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

COFD; Laser diode; Light absorption; Thermoreflectance

Indexed keywords

ELECTRODES; LIGHT ABSORPTION; LIGHT EMISSION; LIGHT REFLECTION; TEMPERATURE MEASUREMENT;

DIODE LIGHT EFFICIENCY; MULTIPLE QUANTUM WELLS; THERMOREFLECTANCE;

QUANTUM WELL LASERS;

EID: 0035480193     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(01)00079-9     Document Type: Article

References (3)

1. Measurement of absolute temperatures upon metallic lines under current stress by laser probing
2. Laser probing techniques and methods for the thermal characterisation of microelectronic components
3. Calibration procedure of temperature measurements by thermoreflectance upon microelectronic devices