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Volumn 76, Issue 2, 2000, Pages 203-205
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Near-field photoluminescence imaging of single defects in a ZnSe quantum-well structure at low temperatures
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000618168
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.125720 Document Type: Article |
Times cited : (17)
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References (7)
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