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Volumn 76, Issue 2, 2000, Pages 203-205

Near-field photoluminescence imaging of single defects in a ZnSe quantum-well structure at low temperatures

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[No Author keywords available]

Indexed keywords


EID: 0000618168     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125720     Document Type: Article
Times cited : (17)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.