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Volumn 202, Issue , 2003, Pages 93-99

Molecular dynamics study of defect formation in GaN cascades

Author keywords

Defects; GaN; Irradiation; Semiconductors

Indexed keywords

CHEMICAL BONDS; COMPUTER SIMULATION; DEFECTS; GALLIUM NITRIDE; ION BOMBARDMENT; MOLECULAR DYNAMICS; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0037378213     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01839-6     Document Type: Conference Paper
Times cited : (74)

References (32)
  • 2
    • 0012538739 scopus 로고    scopus 로고
    • See for example http://www.nichia.co.jp/.
  • 26
    • 77956670565 scopus 로고    scopus 로고
    • H. Ehrenfest, & F. Spaepen. New York: Academic Press
    • Averback R.S., Diaz de la Rubia T. Ehrenfest H., Spaepen F. Solid State Physics. Vol. 51:1998;281 Academic Press, New York.
    • (1998) Solid State Physics , vol.51 , pp. 281
    • Averback, R.S.1    Diaz de la Rubia, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.