|
Volumn 526, Issue 3, 2003, Pages 356-366
|
Tight binding studies of strained Ge/Si(0 0 1) growth
|
Author keywords
Computer simulations; Germanium; Semiconductor semiconductor heterostructures; Silicon; Surface stress
|
Indexed keywords
COMPUTER SIMULATION;
FILM GROWTH;
GERMANIUM;
SILICON;
STRAIN;
TIGHT BINDING;
MONOLAYERS;
|
EID: 0037368927
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(02)02686-9 Document Type: Article |
Times cited : (16)
|
References (22)
|