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Volumn 526, Issue 3, 2003, Pages 356-366

Tight binding studies of strained Ge/Si(0 0 1) growth

Author keywords

Computer simulations; Germanium; Semiconductor semiconductor heterostructures; Silicon; Surface stress

Indexed keywords

COMPUTER SIMULATION; FILM GROWTH; GERMANIUM; SILICON; STRAIN;

EID: 0037368927     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02686-9     Document Type: Article
Times cited : (16)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.