Evolution of the strain relaxation in a Ge layer on Si(001) by reconstruction and intermixing

Physical Review B - Condensed Matter and Materials Physics

Volumn 60, Issue 8, 1999, Pages R5121-R5124

  Voigtländer, Bert ^a   Kästner, Martin ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001024706     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.R5121     Document Type: Article

References (17)

1. U. Köhler, O. Jusko, B. Müller, M. Horn-von Hoegen and M. Pook, Ultramicroscopy, 42-44, 832, (1992).
2. F. Iwawaki, M. Tomitori and O. Nishikawa, Ultramicroscopy, 42-44, 902, (1992).
3. Fang Wu and M. G. Lagally, Phys. Rev. Lett., 75, 2534, (1995).
4. J. Tersoff, Phys. Rev. B, 45, 8833, (1992).
5. Feng Liu and M. G. Lagally, Phys. Rev. Lett., 76, 3156, (1996).
6. R. Butz and S. Kampers, Appl. Phys. Lett., 61, 1307, (1992).
7. R. M. Tromp, Phys. Rev. B, 47, 7125, (1993).
8. I. Goldfarb, J. H. G. Owen, P. T. Hayden, D. R. Bowler, K. Miki and G. A. D. Briggs, Surf. Sci., 394, 105, (1997).
9. B. Voigtländer and A. Zinner, Appl. Phys. Lett., 63, 3055, (1993)
10. B. Voigtländer, A. Zinner and Th. Weber, Rev. Sci. Instrum., 67, 2568, (1996).
11. Feng Liu, Fang Wu and M. G. Lagally, Chem. Rev., 97, 1045, (1997).
12. Ch. Ratsch and A. Zangwill, Surf. Sci., 293, 123, (1993), and references therein.
13. T. Fukuda and T. Ogino, Appl. Phys. A: Mater. Sci. Process., 66, S969, (1998)
14. H. J. W. Zandvliet, B. S. Schwarzentruber, W. Wulfhekel, B. J. Hattink and B. Poelsema, Phys. Rev. B, 57, R6803, (1998)].
15. S. S. Iyer, J. C. Tsang, M. W. Copel, P. R. Pukite and R. M. Tromp, Appl. Phys. Lett., 54, 218, (1989).
16. L. Patthey, E. L. Bullock, T. Abukawa, S. Kono and L. S. O. Johansson, Phys. Rev. Lett., 75, 2538, (1995).
17. Feng Liu (private communication).