메뉴 건너뛰기




Volumn 51, Issue 3, 2003, Pages 1045-1051

Effect of baseband impedance on FET intermodulation

Author keywords

FET amplifiers; Impedance; Intermodulation distortion; Nonlinear distortion; Volterra series

Indexed keywords

AMPLIFIERS (ELECTRONIC); FIELD EFFECT TRANSISTORS; INTERMODULATION; NONLINEAR DISTORTION;

EID: 0037359890     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2003.808704     Document Type: Article
Times cited : (99)

References (15)
  • 4
    • 0031636069 scopus 로고    scopus 로고
    • A novel envelope-termination load-pull method for ACPR optimization of RF/microwave power amplifiers
    • J. F. Sevic, K. L. Burger, and M. B. Steer, "A novel envelope-termination load-pull method for ACPR optimization of RF/microwave power amplifiers," in IEEE MTT-S Int. Microwave Symp. Dig., 1998, pp. 723-726.
    • IEEE MTT-S Int. Microwave Symp. Dig., 1998 , pp. 723-726
    • Sevic, J.F.1    Burger, K.L.2    Steer, M.B.3
  • 5
    • 0030719762 scopus 로고    scopus 로고
    • The effect of a variation in tone spacing on the intermodulation performance of class A and class AB HBT power amplifiers
    • P. M. McIntosh and C. M. Snowden, "The effect of a variation in tone spacing on the intermodulation performance of class A and class AB HBT power amplifiers," in IEEE MTT-S Int. Microwave Symp. Dig., 1997, pp. 371-374.
    • IEEE MTT-S Int. Microwave Symp. Dig., 1997 , pp. 371-374
    • McIntosh, P.M.1    Snowden, C.M.2
  • 6
    • 0035694802 scopus 로고    scopus 로고
    • Analysis of low frequency memory and influence on solid state HPA intermodulation characteristics
    • N. Le Gallou, J. M. Nebus, E. Ngoya, and H. Buret, "Analysis of low frequency memory and influence on solid state HPA intermodulation characteristics," in IEEE MTT-S Int. Microwave Symp. Dig., 2001, pp. 979-982.
    • IEEE MTT-S Int. Microwave Symp. Dig., 2001 , pp. 979-982
    • Le Gallou, N.1    Nebus, J.M.2    Ngoya, E.3    Buret, H.4
  • 7
    • 0036070083 scopus 로고    scopus 로고
    • Novel technique for determining bias, temperature and frequency dependence of FET characteristics
    • A. E. Parker and J. G. Rathmell, "Novel technique for determining bias, temperature and frequency dependence of FET characteristics," in IEEE MTT-S Int. Microwave Symp. Dig., 2002, pp. 993-996.
    • IEEE MTT-S Int. Microwave Symp. Dig., 2002 , pp. 993-996
    • Parker, A.E.1    Rathmell, J.G.2
  • 8
    • 0036075577 scopus 로고    scopus 로고
    • Extraction of accurate behavioral models for power amplifiers with memory effects using two-tone measurements
    • H. Ku, M. D. Mckinley, and J. S. Kenney, "Extraction of accurate behavioral models for power amplifiers with memory effects using two-tone measurements," in IEEE MTT-S Int. Microwave Symp. Dig., 2002, pp. 139-142.
    • IEEE MTT-S Int. Microwave Symp. Dig., 2002 , pp. 139-142
    • Ku, H.1    Mckinley, M.D.2    Kenney, J.S.3
  • 11
    • 0036736269 scopus 로고    scopus 로고
    • A comprehensive explanation of distortion sideband asymmetries
    • Sept.
    • N. B. De Carvalho and J. C. Pedro, "A comprehensive explanation of distortion sideband asymmetries," IEEE Trans. Microwave Theory Tech., vol. 50, pp. 2090-2101, Sept. 2002.
    • (2002) IEEE Trans. Microwave Theory Tech. , vol.50 , pp. 2090-2101
    • De Carvalho, N.B.1    Pedro, J.C.2
  • 13
    • 0027961880 scopus 로고
    • Accurate simulation of GaAs MESFET's intermodulation distortion using a new drain-source current model
    • Jan.
    • J. C. Pedro and J. Perez, "Accurate simulation of GaAs MESFET's intermodulation distortion using a new drain-source current model," IEEE Trans. Microwave Theory Tech., vol. 42, pp. 25-33, Jan. 1994.
    • (1994) IEEE Trans. Microwave Theory Tech. , vol.42 , pp. 25-33
    • Pedro, J.C.1    Perez, J.2
  • 14
    • 0344509467 scopus 로고
    • Third-order intermodulation distortion in cascaded stages
    • June
    • S. A. Maas, "Third-order intermodulation distortion in cascaded stages," IEEE Microwave Guided Wave Lett., vol. 5, pp. 189-191, June 1995.
    • (1995) IEEE Microwave Guided Wave Lett. , vol.5 , pp. 189-191
    • Maas, S.A.1
  • 15
    • 0343603477 scopus 로고    scopus 로고
    • New model extraction for predicting distortion in HEMT and MESFET circuits
    • Sept.
    • G. Qu and A. E. Parker, "New model extraction for predicting distortion in HEMT and MESFET circuits," IEEE Microwave Guided Wave Lett., vol. 9, pp. 363-365, Sept. 1999.
    • (1999) IEEE Microwave Guided Wave Lett. , vol.9 , pp. 363-365
    • Qu, G.1    Parker, A.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.