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Volumn 9, Issue 9, 1999, Pages 363-365
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New Model Extraction for Predicting Distortion in HEMT and MESFET Circuits
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Author keywords
Intermodulation distortion; MODFET's; nonlinear distortion; semiconductor device modelling; Volterra series
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Indexed keywords
HIGH ELECTRON MOBILITY TRANSISTORS;
MESFET DEVICES;
NONLINEAR DISTORTION;
SEMICONDUCTOR DEVICE MODELS;
INTERMODULATION DISTORTION;
VOLTERRA SERIES;
INTERMODULATION MEASUREMENT;
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EID: 0343603477
PISSN: 10518207
EISSN: None
Source Type: Journal
DOI: 10.1109/75.790475 Document Type: Article |
Times cited : (18)
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References (5)
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