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Volumn , Issue , 2001, Pages 182-185

MEMS-based gray-scale lithography

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC ETCHING; ANISOTROPY; DRY ETCHING; FABRICATION; LITHOGRAPHY; PHOTOLITHOGRAPHY; PHOTORESISTS; SEMICONDUCTOR DEVICES; WET ETCHING;

EID: 84961785398     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISDRS.2001.984470     Document Type: Conference Paper
Times cited : (19)

References (5)
  • 1
    • 0031653880 scopus 로고    scopus 로고
    • Combining Microstereolithography and thick resist UV lithography for 3D microfabrication
    • Germany
    • A. Bertsch, H. Lorenz and P. Renaud, "Combining Microstereolithography and thick resist UV lithography for 3D microfabrication", Proc. IEEE MEMS '98 Heidelberg, Germany, pp. 18-23, 1998.
    • (1998) Proc. IEEE MEMS '98 Heidelberg , pp. 18-23
    • Bertsch, A.1    Lorenz, H.2    Renaud, P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.