A new bidimensional histogram for the dynamic characterization of ADCs

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 1, 2003, Pages 38-45

  Acunto, Salvatore ^a   Arpaia, Pasquale ^b   Hummels, Donald M ^c   Irons, Fred H ^c  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b UNIVERSITY OF SANNIO   (Italy)

^c University of Maine   (United States)

Author keywords

Analog digital conversion; Calibration; Circuit testing; Error analysis; Error compensation; Modeling

Indexed keywords

COMPUTER SIMULATION; ERROR ANALYSIS; INSTRUMENT TESTING; PROBABILITY DISTRIBUTIONS;

HISTOGRAMS;

ANALOG TO DIGITAL CONVERSION;

EID: 0037311539     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.809115     Document Type: Article

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