ADC sinewave histogram testing with quasi-coherent sampling

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 4, 2001, Pages 949-953

  Carbone, Paolo ^a,b   Chiorboli, Giovanni ^a,c  

^a IEEE   (Italy)

^b UNIVERSITY OF PERUGIA   (Italy)

^c UNIVERSITY OF PARMA   (Italy)

Author keywords

Analog digital conversion; Data acquisition; Electronic equipment testing; Synchronization; Testing

Indexed keywords

SINEWAVE HISTOGRAM TESTING;

COMPUTER SIMULATION; DATA ACQUISITION; ELECTRONIC EQUIPMENT TESTING; SAMPLING; SYNCHRONIZATION;

ANALOG TO DIGITAL CONVERSION;

EID: 0035414645     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.948305     Document Type: Conference Paper

References (9)

1. Dynamic testing and diagnostic of A/D converters
2. Histogram measurement of ADC nonlinearities using sine waves
3. Step and ADC frequency response testing of waveform recorders
4. Standard for digitizing waveform recorders
5. About the number of records to be acquired for histogram testing of A/D converter using synchronous sinewave and clock generators
6. Design of ADC histogram test
7. Quasicoherent equivalent-time sampling