Structural characterization of InGaN/GaN multi-quantum well structures using high-resolution XRD

Journal of the Korean Physical Society

Volumn 42, Issue SPEC., 2003, Pages

  Kim, Young Hoon ^a   Kim, Chang Soo ^a   Noh, Sam Kyu ^a   Ban, Seung Il ^a   Kim, Sung Gu ^a   Lim, Kee Young ^b   Byung Sung, O ^c  

^a Korea Research Institute of Standards and Science   (South Korea)

^b Chonbuk National University   (South Korea)

^c Chungnam National University   (South Korea)

Author keywords

High resolution XRD; InGaN GaN MQW; Structural characterization

Indexed keywords

EID: 0037305193     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (11)

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