High-resolution x-ray analysis of InGaN/GaN superlattices grown on sapphire substrates with GaN layers

Applied Physics Letters

Volumn 69, Issue 22, 1996, Pages 3390-3392

  Li, Wei ^a   Bergman, Peder ^a   Ivanov, Ivan ^a   Ni, Wei Xin ^a   Amano, H ^b   Akasa, I ^b  

^a LINKÖPING UNIVERSITY   (Sweden)

^b MEIJO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5644284809     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117269     Document Type: Article

References (9)

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