|
|
|
Volumn 32, Issue 1, 1999, Pages 50-62
|
|
Performance and physical mechanisms in deep submicron SOI MOSFETs
|
|
Author keywords
[No Author keywords available]
|
|
Indexed keywords
ELECTRIC CURRENTS;
ELECTRIC PROPERTIES;
HOT CARRIERS;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DEVICE STRUCTURES;
SEMICONDUCTOR DOPING;
SILICON ON INSULATOR TECHNOLOGY;
DEEP SUBMICRON;
DRAIN CURRENT;
SHORT CHANNEL EFFECT;
SUBTHRESHOLD SWING;
MOSFET DEVICES;
|
|
EID: 0032677504
PISSN: 00709816
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
|
Times cited : (4)
|
|
References (40)
|
