Wideband Frequency-Domain Characterization of High-Impedance Probes

58th ARFTG Conference Digest Fall 2001: RF Measurements for a Wireless World, ARFTG Fall 2001

Volumn , Issue , 2001, Pages

  Arz, Uwe ^a   Reader, Howard C ^a   Kabos, Pavel ^a   Williams, Dylan F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Calibration; Coplanar waveguides; Digital circuits; Electric variables; Fixtures; Frequency measurement; Integrated circuit measurements; Probes; Scattering parameters; Wideband

Indexed keywords

CALIBRATION; CHARACTERIZATION; COPLANAR WAVEGUIDES; DIGITAL CIRCUITS; DIGITAL INTEGRATED CIRCUITS; FIXTURES (TOOLING); PROBES; SCATTERING PARAMETERS; WIRELESS TELECOMMUNICATION SYSTEMS;

CHARACTERIZATION METHODS; ELECTRIC VARIABLES; FREQUENCY MEASUREMENTS; INTEGRATED CIRCUIT MEASUREMENTS; MICROWAVE PROPERTY; WAVEFORM MEASUREMENT; WIDE BAND FREQUENCIES; WIDE-BAND;

FREQUENCY DOMAIN ANALYSIS;

EID: 84949638581     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2001.327491     Document Type: Conference Paper

References (4)

1. G. David, T.-Y. Yun, M.H. Crites, J.F. Whitaker, T.R. Weatherford, K. Jobe, S. Meyer, M.J. Bustamante, B. Goyette, S. Thomas III, and K.R. Elliott, "Absolute Potential Measurements Inside Microwave Digital IC's Using aMicromachined Photoconductive Sampling Probe", IEEE Trans. Microwave Theory Tech., vol. 46, no. 12, pp. 2330-2337, Dec. 1998.
2. D.W. van der Weide, "Localized Picosecond Resolution With a Near-field Microwave/Scanning-force Microscope", Applied Phys. Lett, vol. 70, no. 6, pp. 677-679, Feb. 1997.
3. R.F. Bauer, and P. Penfield, "De-Embedding and Unterminating", IEEE Trans. Microwave Theory Tech., vol. MTT-22, no. 3, pp. 282-288, March 1974.
4. R.B. Marks, "A Multiline Method of Network Analyzer Calibration", IEEE Trans. Microwave Theory Tech., vol. MTT-39, no. 7, pp. 1205-1215, July 1991.