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Volumn 21, Issue 1, 2003, Pages 116-126

Effect of neutral transport on the etch product lifecycle during plasma etching of silicon in chlorine gas

Author keywords

[No Author keywords available]

Indexed keywords

CHLORINE; COMPUTER SIMULATION; DIELECTRIC PROPERTIES OF SOLIDS; DIFFUSION IN SOLIDS; SILICON WAFERS; SURFACE REACTIONS; TRANSPORT PROPERTIES; VAN DER WAALS FORCES;

EID: 0037273431     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1527952     Document Type: Article
Times cited : (27)

References (22)
  • 10
    • 0013307986 scopus 로고    scopus 로고
    • Semiconductor International Association, International Technology Roadmap for Semiconductors:
    • Semiconductor International Association, International Technology Roadmap for Semiconductors: http://public.itrs.net (2001).
    • (2001)
  • 17
    • 0013310468 scopus 로고
    • edited by J. Potter (American Institute of Aeronautics and Astronautics, New York)
    • R. H. Edwards, in Rarefied Gas Dynamics, edited by J. Potter (American Institute of Aeronautics and Astronautics, New York, 1977).
    • (1977) Rarefied Gas Dynamics
    • Edwards, R.H.1
  • 18
    • 0013249299 scopus 로고    scopus 로고
    • Masters thesis, University of California, Berkeley, CA
    • A. V. Gorestsky, Masters thesis, University of California, Berkeley, CA, 2000
    • (2000)
    • Gorestsky, A.V.1
  • 22
    • 0013299774 scopus 로고    scopus 로고
    • doctoral dissertation, University of California, Berkeley CA
    • G. P. Kota, doctoral dissertation, University of California, Berkeley CA, 2000.
    • (2000)
    • Kota, G.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.