메뉴 건너뛰기




Volumn , Issue , 2003, Pages 255-262

Dynamic compact models of cooling mounts for fast board level design

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; COMPUTER SIMULATION; COOLING; ELECTRONICS PACKAGING; HEAT RESISTANCE; HEAT SINKS; HEAT TRANSFER COEFFICIENTS; OPTIMIZATION; SEMICONDUCTOR JUNCTIONS; SURFACE MOUNT TECHNOLOGY; TEMPERATURE DISTRIBUTION; TEMPERATURE MEASUREMENT; ASSEMBLY; CHIP SCALE PACKAGES; ELECTRIC NETWORK TOPOLOGY; ELECTRONIC COOLING; PROFITABILITY; SEMICONDUCTOR DEVICES; SEMICONDUCTOR INSULATOR BOUNDARIES; TEMPERATURE; THERMAL VARIABLES MEASUREMENT;

EID: 0037272310     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (22)

References (9)
  • 1
    • 0036214740 scopus 로고    scopus 로고
    • Inclusion of RC compact models of packages into board level thermal simulation tools
    • M. Rencz et al. Inclusion of RC compact models of packages into board level thermal simulation tools, Proc. of SEMITHERM XVII, San Jose, CA, pp 71-76 (2002)
    • (2002) Proc. of SEMITHERM XVII, San Jose, CA , pp. 71-76
    • Rencz, M.1
  • 2
    • 0034996355 scopus 로고    scopus 로고
    • The conceivable accuracy of experimental and numerical thermal analyses of electronic systems
    • C. Lasance: The Conceivable Accuracy of Experimental and Numerical Thermal Analyses of Electronic Systems, Appendix C, Proc. of SEMITHERM XVII, San Jose, CA, pp. 180-198 (2001)
    • (2001) Appendix C, Proc. of SEMITHERM XVII, San Jose, CA , pp. 180-198
    • Lasance, C.1
  • 3
    • 0002500473 scopus 로고
    • A novel approach for the thermal characterization of electronic parts
    • C. Lasance et al. A Novel Approach for the Thermal Characterization of Electronic Parts, Proc. of SEMITHERM XI, San Jose, CA, pp. 1-9 (1995)
    • (1995) Proc. of SEMITHERM XI, San Jose, CA , pp. 1-9
    • Lasance, C.1
  • 4
    • 0032676548 scopus 로고    scopus 로고
    • Creation and evaluation of compact models for thermal characterisation using dedicated optimisation software
    • C. Lasance, D. den Hertog, P. Stehouwer P: Creation and Evaluation of Compact Models for Thermal Characterisation Using Dedicated Optimisation Software, Proc. of SEMITHERM XV, San Diego, CA, pp. 189-200 (1999)
    • (1999) Proc. of SEMITHERM XV, San Diego, CA , pp. 189-200
    • Lasance, C.1    Den Hertog, D.2    Stehouwer, P.P.3
  • 5
    • 0036212684 scopus 로고    scopus 로고
    • Determining partial thermal resistances with transient measurements and using the method to detect die attach discontinuities
    • M. Rencz, et al. Determining partial thermal resistances with transient measurements and using the method to detect die attach discontinuities, Proc. of SEMITHERM XVII, San Jose, CA, pp 15-20 (2002)
    • (2002) Proc. of SEMITHERM XVII, San Jose, CA , pp. 15-20
    • Rencz, M.1
  • 6
    • 0013179723 scopus 로고    scopus 로고
    • Dynamic temperature measurements: Tools providing a look into package and mount structures
    • May
    • A. Poppe, V. Székely Dynamic Temperature Measurements: Tools Providing a Look into Package and Mount Structures, Electr. Cooling Magazin, Vol. 8, No. 2, May 2002. www.electronics-cooling.com/html/2002_may_a1.html
    • (2002) Electr. Cooling Magazin , vol.8 , Issue.2
    • Poppe, A.1    Székely, V.2
  • 7
    • 0032314440 scopus 로고    scopus 로고
    • A generic methodology for deriving compact dynamic thermal models, applied to the PSGA package
    • H. Christiaens et al. A Generic Methodology for Deriving Compact Dynamic Thermal Models, Applied to the PSGA package. IEEE Trans. On Components, Packaging and Manufact. Technology, Part A Vol 21, pp 565-576 (1998)
    • (1998) IEEE Trans. On Components, Packaging and Manufact. Technology, Part A , vol.21 , pp. 565-576
    • Christiaens, H.1
  • 8
    • 0342656550 scopus 로고    scopus 로고
    • THERMAN: A thermal simulation tool for IC chips, microstructures and PW boards
    • V. Székely et al. THERMAN: a thermal simulation tool for IC chips, microstructures and PW boards. Microelectronics Reliability, Vol. 40, pp. 517-524 (2000)
    • (2000) Microelectronics Reliability , vol.40 , pp. 517-524
    • Székely, V.1
  • 9
    • 0003063526 scopus 로고    scopus 로고
    • The accuracy of BCI compact thermal models for non-uniformly distributed boundary conditions
    • C. Lasance The Accuracy of BCI Compact Thermal Models for Non-Uniformly Distributed Boundary Conditions. Proc. 8th THERMINIC Workshop, pp. 251-259 (2002)
    • (2002) Proc. 8th THERMINIC Workshop , pp. 251-259
    • Lasance, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.