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Volumn 4, Issue SUPPL. 1, 2003, Pages 59-64

Two new mechanisms for laser cleaning using Nd:YAG sources

Author keywords

Angular cleaning; Cleaning of marble; Laser cleaning mechanisms; Shock cleaning

Indexed keywords


EID: 0037255131     PISSN: 12962074     EISSN: None     Source Type: Journal    
DOI: 10.1016/s1296-2074(02)01229-3     Document Type: Article
Times cited : (48)

References (23)
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    • Lu Y.F. Sung W.D. Hong M.H. Laser removal of particles from magnetic head sliders Journal of Applied Physics 80 1 1996 499 504
    • (1996) Journal of Applied Physics , vol.80 , Issue.1 , pp. 499-504
    • Lu, Y.F.1    Sung, W.D.2    Hong, M.H.3
  • 15
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    • Laser-assisted removal of particles on silicon wafers
    • Vereecke G. Rohr E. Heyns M.M. Laser-assisted removal of particles on silicon wafers Journal of Applied Physics 85 7 1999 3837 3843
    • (1999) Journal of Applied Physics , vol.85 , Issue.7 , pp. 3837-3843
    • Vereecke, G.1    Rohr, E.2    Heyns, M.M.3
  • 16
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    • A quantitative analysis of single pulse ultraviolet dry laser cleaning
    • Halfpenny D. Kane D.M. A quantitative analysis of single pulse ultraviolet dry laser cleaning Journal of Applied Physics 86 12 1999 6641 6646
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    • Halfpenny, D.1    Kane, D.M.2
  • 17
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  • 19
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    • Laser Shock Cleaning Proceedings of the 19th International Congress on Applications of Lasers and Electro-Optics, Dearborn, October 2-5 (ICALEO 2000) Section D
    • Lee J.M. Watkins K.G. Steen W.M. Laser shock cleaning Proceedings of the 19th International Congress on Applications of Lasers and Electro-Optics Dearborn, October 2-5 (ICALEO 2000) Section D 2000 (pp.171-178)
    • (2000) , pp. 171-178
    • Lee, J.M.1    Watkins, K.G.2    Steen, W.M.3
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    • Bowling, R.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.