A CMOS image sensor with dark-current cancellation and dynamic sensitivity operations

IEEE Transactions on Electron Devices

Volumn 50, Issue 1, 2003, Pages 91-95

  Cheng, Hsiu Yu ^a   King, Ya Chin ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

CMOS image sensor; Dark current; Dynamic range

Indexed keywords

CHARGE CARRIERS; CMOS INTEGRATED CIRCUITS; HETEROJUNCTIONS; LEAKAGE CURRENTS; LOGIC DESIGN; PHOTODIODES; SEMICONDUCTOR DEVICE STRUCTURES; THRESHOLD VOLTAGE;

CMOS IMAGE SENSORS; DARK-CURRENT CANCELLATION; FIXED PATTERN NOISE;

IMAGE SENSORS;

EID: 0037253030     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2002.806964     Document Type: Article

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