Microstructural characterization of InxGa 1-x N MBE samples

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 200, Issue , 2003, Pages 114-119

  Katsikini, M ^a   Paloura, E C ^a   Boscherini, F ^b   D'Acapito, F ^c   Lioutas, C B ^a   Doppalapudi, D ^d,e  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^b UNIVERSITY OF BOLOGNA   (Italy)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d Boston University   (United States)

^e Boston MicroSystems Inc   (United States)

Author keywords

EXAFS; Microstructure; Semiconductors; Ternary alloys; X ray absorption

Indexed keywords

COMPOSITION; ELECTRON CYCLOTRON RESONANCE; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; PHASE SEPARATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

TERNARY ALLOYS;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0037241380     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01706-8     Document Type: Conference Paper

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