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Volumn 216, Issue 1, 1999, Pages 151-156
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Extended x-ray absorption fine structure (EXAFS) of InN and InGaN
c
SAGA UNIVERSITY
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0033242864
PISSN: 03701972
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1521-3951(199911)216:1<151::AID-PSSB151>3.0.CO;2-7 Document Type: Article |
Times cited : (18)
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References (11)
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