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Volumn 216, Issue 1, 1999, Pages 151-156

Extended x-ray absorption fine structure (EXAFS) of InN and InGaN

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Indexed keywords


EID: 0033242864     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-3951(199911)216:1<151::AID-PSSB151>3.0.CO;2-7     Document Type: Article
Times cited : (18)

References (11)
  • 5
    • 85033956170 scopus 로고    scopus 로고
    • PhD Thesis, University of Ghent, unpublished
    • WIM VAN DER STRICHT, PhD Thesis, University of Ghent, 1999, unpublished.
    • (1999)
    • Van Der Stricht, W.1
  • 9
    • 0002753260 scopus 로고    scopus 로고
    • Properties of indium nitride
    • B. GIL and M. LEROUX, Properties of Indium Nitride, in: EMIS Datareview 23, 1999.
    • (1999) EMIS Datareview , pp. 23
    • Gil, B.1    Leroux, M.2
  • 11
    • 0033242871 scopus 로고    scopus 로고
    • K.P. O'DONNELL, M.E. WHITE, S. PEREIRA, M.F. WU, A. VANTOMME, W. VAN DER STRICHT, and K. JACOBS, 3rd Internat. Conf. Nitride Semiconductors, Montpellier, July 5 to 9, 1999; phys. stat. sol. (b) 216, 171 (1999).
    • (1999) Phys. Stat. Sol. (B) , vol.216 , pp. 171


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.