A comparison of EDS microanalysis in FIB-prepared and electropolished TEM thin foils

Ultramicroscopy

Volumn 94, Issue 1, 2003, Pages 37-48

  Hutchinson, C R ^a   Hackenberg, R E ^b   Shiflet, G J ^c  

^a UNIV GRENOBLE ALPES   (France)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c University of Virginia   (United States)

Author keywords

Specimen preparation; X ray microanalysis

Indexed keywords

BINARY ALLOYS; COPPER; ELECTROLYTIC POLISHING; ENERGY DISPERSIVE SPECTROSCOPY; ISOTHERMS; MICROANALYSIS; PRECIPITATION (CHEMICAL); STOICHIOMETRY; TITANIUM;

CELLULAR COLONIES;

METAL FOIL;

ALLOY; COPPER; GALLIUM; TITANIUM;

ABSORPTION; ARTICLE; ARTIFACT; CELL CULTURE; CHEMICAL COMPOSITION; CHEMISTRY; ELECTRON PROBE MICROANALYSIS; FIELD EMISSION; HEAT TREATMENT; IMAGE QUALITY; ISOTHERM; MICROANALYSIS; PRECIPITATION; QUANTITATIVE ANALYSIS; SOLUTE; STOICHIOMETRY; TRANSMISSION ELECTRON MICROSCOPY; X RAY MICROANALYSIS;

EID: 0037212353     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00193-6     Document Type: Article

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