Analysis of the anomalous drain current characteristics of halo MOSFETs

Solid-State Electronics

Volumn 47, Issue 1, 2003, Pages 99-106

  Koo, Hoewoo ^a   Lee, Kieyoung ^a   Lee, Kyungho ^b   Fjeldly, Tor A ^c   Shur, Michael S ^d  

^a Chungbuk National University   (South Korea)

^b Hong Ik University   (South Korea)

^c NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

^d RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

Drain current modeling; Halo structure; MOSFET; Subthreshold; Threshold voltage

Indexed keywords

CHARGE TRANSFER; COMPUTER SIMULATION; ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; THRESHOLD VOLTAGE;

DRAIN CURRENT;

MOSFET DEVICES;

EID: 0037211010     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(02)00268-X     Document Type: Article

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