Electrical aging of molybdenum field emitters

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 21, Issue 1 SPEC., 2003, Pages 440-444

  Lee, Jong Duk ^a   Oh, Chang Woo ^a   Park, Byung Gook ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CURRENT VOLTAGE CHARACTERISTICS; DESORPTION; ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; MOLYBDENUM; SEMICONDUCTING SILICON; SUBSTRATES; SURFACE ROUGHNESS;

ELECTRIC AGING; EMISSION CURRENTS; MOLYBDENUM FIELD EMITTERS;

FIELD EMISSION DISPLAYS;

EID: 0037207734     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1527643     Document Type: Article

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