Emission uniformity enhancement between microfabricated tips in cold cathode arrays

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 19, Issue 2, 2001, Pages 582-584

  Schwoebel, P R ^a   Spindt, C A ^a   Holland, C E ^a   Panitz, J A ^b  

^a SRI INTERNATIONAL   (United States)

^b UNIVERSITY OF NEW MEXICO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON EMISSION; HEATING; IMAGING TECHNIQUES;

COLD CATHODE ARRAYS; ELECTRON EMISSION CURRENT DENSITIES; EMISSION UNIFORMITY ENHANCEMENT; EMITTED ELECTRON CURRENT; MICROFABRICATED FIELD EMITTER; MICROFABRICATED TIPS;

FIELD EMISSION CATHODES;

EID: 0035272709     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1347041     Document Type: Article

References (9)

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