Far-infrared spectroscopic study of GaAs multi-layer n + -i structures

Applied Surface Science

Volumn 199, Issue 1-4, 2002, Pages 160-165

  Yu, G ^a   Zhang, Y H ^a   Shen, W Z ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

Far infrared spectroscopy; Fresnel matrix method; GaAs multi layer n + i structures

Indexed keywords

DOPING (ADDITIVES); INFRARED SPECTROSCOPY; LIGHT ABSORPTION; MULTILAYERS; PHOTONS; RADIATION DETECTORS; SEMICONDUCTING GALLIUM ARSENIDE;

FRESNEL MATRIX;

SURFACE REACTIONS;

EID: 0037202088     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00605-0     Document Type: Article

References (13)

1. Werner M.W. Infrared Phys. Technol. 35 1994 539.
2. Berman J.W., Haller E.E. Infrared Phys. Technol. 35 1994 827.
3. Watson D.M., Guptill M.T., Huffman J.E., Krabach T.N., Raines S.N., Satyapal S. J. Appl. Phys. 74 1993 4199.
4. Shen W.Z., Perera A.G.U., Liu H.C., Buchanan M., Schaff W.J. Appl. Phys. Lett. 71 1997 2677.
5. Perera A.G.U., Shen W.Z., Liu H.C., Buchanan M., Tanner M.O., Wang K.L. Appl. Phys. Lett. 72 1998 2307.
6. Yu G., Jiang L.F., Shen W.Z., Wu H.Z. J. Phys. D 35 2002 157.
7. Korotkov A.L., Perera A.G.U., Shen W.Z., Herfort J., Ploog K.H., Schaff W.J., Liu H.C. J. Appl. Phys. 89 2001 3295.
8. Blakemore J.S. J. Appl. Phys. 53 1982 R123.
9. Shen W.Z., Jiang L.F., Yu G., Lai Z.Y., Wang X.G., Shen S.C., Cao X. J. Appl. Phys. 90 2001 5444.
10. H.A. Macleod, Thin-film Optical Filters, 2nd Edition, MacMillan, New York, 1986, 52 pp.
11. Z. Knittl, Optics of Thin Films, Wiley, London, 1976, pp. 35-51.
12. M.V. Klein, T.E. Furtak, Optics, 2nd Edition, Wiley, New York, 1986, pp. 295-300.
13. Ünlü M.S., Strite S. J. Appl. Phys. 78 1995 607.