Scanning tunneling microscopy and in situ spectroscopy of ultra thin Ti films and nano sized TiO x dots induced by STM

Applied Surface Science

Volumn 199, Issue 1-4, 2002, Pages 319-327

  Yin, You ^a   Jiang, Jianfei ^a   Cai, Qiyu ^a   Cai, Bingchu ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

Nano TiO x dots; Scanning tunneling microscopy; Scanning tunneling spectroscopy; Ultra thin Ti film

Indexed keywords

AMORPHOUS FILMS; ELECTRIC POTENTIAL; ENERGY GAP; OXIDATION; SEMICONDUCTOR MATERIALS; SPECTROSCOPY; TITANIUM OXIDES;

SCANNING TUNNELING SPECTROSCOPY (STS);

ULTRATHIN FILMS;

EID: 0037202048     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00893-0     Document Type: Article

References (23)

1. Chandra Babu K.S., Singh D., Srivastava O.N. Semicond. Sci. Technol. 5 1990 364.
2. Gao Y.M., Lee W., Trehan R., Kershaw R., Dwight K., Wold A. Mater. Res. Bull. 26 1991 1247.
3. Ollis D.F. Environ. Sci. Technol. 19 1985 480.
4. J.H. Wohlgemuth, D.B. Warfield, G.A. Johnson, Development of a new low cost antireflective coating technique for solar cells, Conference Paper, Conference Record of the Sixteenth IEEE Photovoltaic Specialists Conference - 1982, IEEE, New York, NY, USA, 1982, pp. 809-812.
5. Siefering K.L., Griffiin G.L. J. Electrochem. Soc. 137 1990 1206.
6. Wu J.M., Chen C.J. J. Am. Ceram. Soc. 73 1990 420.
7. Ono H., Morisaki H., Horiike A., Yazawa K. Jpn. J. Appl. Phys. 29 1990 1157.
8. Bernasik A., Radecka M., Rekas M., Sloma M. Appl. Surf. Sci. 65/66 1993 240.
9. Zhao X.K., McCornick L.D., Fendler J.H. Langmuir 7 1991 1255.
10. Kozlowski M.R., Tyler P.S., Smyrl W.H. Surf. Sci. 194 1988 505.
11. Leitner K., Schultze J.W., Stimming U. J. Electrochem. Soc. 133 1986 1561.
12. Halley J.W., Michalewicz M.T., Tit N. Phys. Rev. B 41 1990 10165.
13. Tit N., Halley J.W. Surf. Interface Anal. 18 1992 87.
14. Tit N., Halley J.W., Michalewicz M.T., Shore H. Appl. Surf. Sci. 65/66 1993 246.
15. Lin Y., Lin R.F., Wang W.B., Xiao X.R. Appl. Surf. Sci. 143 1999 169.
16. Snow E.S., Campbell P.M. Appl. Phys. Lett. 64 1994 1932.
17. Matsumoto K., Takahashi S., Ishii M., Hoshi M., Kurokawa A., Ichimura S., Ando A. Jpn. J. Appl. Phys. 34 1995 1387.
18. Matsumoto K., Ishii M., Segawa K., Oka Y., Vartanian B.J., Hariss J.S. Appl. Phys. Lett. 68 1996 34.
19. K. Matsumoto, Y. Gotoh, T. Maeda, J.A. Dagata, J.S. Harris, Room temperature coulomb oscillation and memory effect for single electron memory made by pulse-mode AFM nano-oxidation process, Technical Digest - International Electron Devices Meeting, 6-9 December 1998, pp. 449-452.
20. Qu X.P., Li B.Z., Ru G.P., Gu Z.G., Xu H.T., Mo H.X., Liu J. Chin. J. Semicond. 19 1998 641.
21. S.N. Magonov, M.H. Whangbo, Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis, VCH Publishers, New York, 1996.
22. Kwetkus B.A., Sattler K. Surf. Sci. 275 1992 201.
23. Matsumoto K. Proc. IEEE 85 1997 612.