Characterization of TiO2 nanocrystalline thin film by scanning tunneling microscopy and scanning tunneling spectroscopy

Applied Surface Science

Volumn 143, Issue 1, 1999, Pages 169-173

  Lin, Yuan ^a   Lin, Ruifeng ^a   Wang, Weibo ^a   Xiao, Xurui ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELECTRIC CONDUCTANCE; ELECTRONIC PROPERTIES; FRACTALS; NANOSTRUCTURED MATERIALS; PORE SIZE; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY; STATISTICAL METHODS; SURFACE ROUGHNESS; SURFACE STRUCTURE; TITANIUM DIOXIDE;

AIR STORED THIN FILMS; BIAS; DIFFERENTIAL CONDUCTANCE; FRACTAL DIMENSION ANALYSIS; NANOCRYSTALLINE THIN FILM; SCANNING TUNNELING SPECTROSCOPY;

THIN FILMS;

EID: 0032653463     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00928-3     Document Type: Article

References (14)

1. Hagfeldt A., Bjorksten U., Lindquist S.-E. Solar Energy Mater. Solar Cells. 27:1992;293.
2. Gorer S., Hodes G. J. Phys. Chem. 98:1994;5338.
3. O'Reagan B., Gratzel M. Nature. 353:1991;737.
4. Hagfeldt A., Vlachopoulos N., Gratzel M. J. Electrochem. Soc. 141:1994;181.
5. Shinohara H., Gratzel M., Vlachopoulos N., Aizawa M. Bioelectrochem. Bioenerg. 26:1991;307.
6. Henglein A. Topics in Current Chemistry. 143:1988;163.
7. Kamat P.V., Dimitrijevie N.M. Solar Energy. 44:1990;83.
8. Zhao X.K., McCornick L.D., Fendler J.H. Langmuir. 7:1991;1255.
9. Fan F.-R.F., Bard A.J. J. Phys. Chem. 94:1990;3761.
10. Gilbert S.E., Kennedy J.H. Surface Science. 225:1990;L1.
11. Wang W.B., Zhang Z.Z., Xiao X.R. Chinese Science Bulletin. 42:1997;310.
12. Pfeifer P. Appl. Surf. Sci. 18:1984;146.
13. Dubuc B., Tricot C. Acad. Sci. Paris. 306:1988;531.
14. Sakamaki K., Itoh K., Fujishima A., Gohahi Y. J. Vac. Sci. Technol. A. 8:1990;614.