Frequency and temperature dependence of the depletion voltage from CV measurements for irradiated Si detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 492, Issue 3, 2002, Pages 402-410

  Campbell, D ^a   Chilingarov, A ^a   Sloan, T ^a  

^a LANCASTER UNIVERSITY   (United Kingdom)

Author keywords

Depletion voltage; Frequency dependence; Irradiated silicon detectors; Temperature dependence

Indexed keywords

ELECTRIC POTENTIAL; FREQUENCIES; IRRADIATION; PERMITTIVITY;

DEPLETION VOLTAGE;

NUCLEAR INSTRUMENTATION;

EID: 0037152355     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(02)01353-0     Document Type: Article

References (11)

1. L. Beattie, A. Chilingarov, P. Ratoff, T. Sloan, Dependence of the depletion voltage and capacitance on temperature and frequency in heavily irradiated silicon diodes, ROSE Technical Note 97/4, March 1997. (The Note is accessible via ROSE webpage (see Ref. 4[4].).
2. Matthews J.A.J. et al. Nucl. Instr. and Meth. A. 381:1996;338.
3. Morgan D., Riedler P. et al. Nucl. Instr. and Meth. A. 426:1999;366.
4. RD48/Rose Collaboration homepage http://rd48.web.cern.ch/RD48.
5. D. Campbell, A. Chilingarov, T. Sloan, Study of the frequency and temperature dependence of the depletion voltage from CV measurements for irradiated Si detectors, ROSE Technical Note /TN/2002-02, February 2002. (The Note is accessible via ROSE webpage (see Ref.4[4].).
6. Angelescu T., Vasilescu A. Nucl. Instr. and Meth. A. 374:1996;85.
7. A. Borowski, O. Krasel, Evaluation of CV-Curves, Proceedings of the First Workshop on Quality Assurance Issues in Silicon Detectors, CERN, May 2001, CERN-Proceedings-2001-001, Geneva, June 2001 pp. 437-443.
8. Campbell D., Chilingarov A., Sloan T. Nucl. Instr. and Meth. A. 466:2001;456.
9. Brodbeck T.J. et al. Nucl. Instr. and Meth. A. 455:2000;645.
10. Lindstroem G. et al. Nucl. Instr. and Meth. A. 466:2001;308.
11. Jones B.K., Santana J., McPherson M. Nucl. Instr. and Meth. A. 395:1997;81.