Structural studies on thin films of an unsubstituted oligo(para-phenylenevinylene)

Thin Solid Films

Volumn 422, Issue 1-2, 2002, Pages 104-111

  Veenstra, S C ^a   Van Hutten, P F ^a   Post, A ^a   Wang, Y ^a   Hadziioannou, G ^a   Jonkman, H T ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

Electron diffraction; Evaporation; Organic semiconductors; Surface morphology

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; OLIGOMERS; POLYCRYSTALLINE MATERIALS; SILICON WAFERS; SINGLE CRYSTALS; VAPOR DEPOSITION; X RAY DIFFRACTION ANALYSIS;

VACCUM DEPOSITION;

THIN FILMS;

EID: 0037147262     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00983-5     Document Type: Article

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