Atomistic morphology and structure of ethylene-chemisorbed Si(0 0 1)2 × 1 surface

Surface Science

Volumn 504, Issue , 2002, Pages 19-27

  Shimomura, M ^a   Munakata, M ^a   Iwasaki, A ^b   Ikeda, M ^b   Abukawa, T ^a   Sato, K ^a   Kawawa, T ^a   Shimizu, H ^b   Nagashima, N ^b   Kono, S ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b NIHON UNIVERSITY   (Japan)

Author keywords

Alkenes; Photoelectron diffraction; Scanning tunneling microscopy; Silicon; Surface relaxation and reconstruction; Surface structure, morphology, roughness, and topography

Indexed keywords

CHEMISORPTION; ETHYLENE; MONOLAYERS; MORPHOLOGY; OLEFINS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SURFACE ROUGHNESS; SURFACE STRUCTURE;

ATOMISTIC MORPHOLOGY; PHOTOELECTRON DIFFRACTION;

SURFACE CHEMISTRY;

EID: 0037140030     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)01157-3     Document Type: Article

References (16)