The overlayer structure on the Si(001)-(2×3)-Ag surface determined by X-ray photoelectron diffraction

Surface Review and Letters

Volumn 5, Issue 5, 1998, Pages 953-958

  Shimomura, M ^a   Abukawa, T ^a   Higa, M ^a   Nakamura, M ^a,b   Shivaprasad, S M ^a,c   Yeom, H W ^a,d   Suzuki, S ^a   Sato, S ^a   Tani, J ^a   Kono, S ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b MITSUBISHI ELECTRIC CORPORATION   (Japan)

^c NATIONAL PHYSICAL LABORATORY   (India)

^d UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11744288691     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X98001286     Document Type: Article

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