|
Volumn 84, Issue 5, 2000, Pages 939-942
|
Photoelectron diffraction imaging for C2H2 and C2H4 chemisorbed on Si(100) reveals a new bonding configuration
a a,d a a,e a,f a b b,g c
f
IBM
(United States)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 0000366377
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.84.939 Document Type: Article |
Times cited : (89)
|
References (15)
|