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Volumn 16, Issue 1-2, 2002, Pages 275-280
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X-ray analysis and microhardness characterization of TiN/Ti multilayers
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Author keywords
[No Author keywords available]
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Indexed keywords
TIN;
TITANIUM;
CALCULATION;
CONFERENCE PAPER;
CRYSTAL;
FILM;
HARDNESS;
MATHEMATICAL ANALYSIS;
STRUCTURE ANALYSIS;
X RAY ANALYSIS;
X RAY DIFFRACTION;
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EID: 0037138078
PISSN: 02179792
EISSN: None
Source Type: Journal
DOI: 10.1142/s0217979202009755 Document Type: Conference Paper |
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Times cited : (2)
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References (16)
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