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Volumn 87, Issue 3, 2000, Pages 1235-1244

Production and structural characterization of BN/TiN multilayers

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000609888     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372002     Document Type: Article
Times cited : (8)

References (29)
  • 21
    • 0346602228 scopus 로고
    • International Center for Diffraction Data, Swarthmore, PA
    • File 38-1420, ICCD database (International Center for Diffraction Data, Swarthmore, PA, 1994).
    • (1994) File 38-1420, ICCD Database


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.