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Volumn 14, Issue 48, 2002, Pages 12767-12776

Burgers vector analysis of large area misfit dislocation arrays from bend contour contrast in transmission electron microscope images

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); SEMICONDUCTOR DEVICE MODELS; STRAIN RATE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0037122151     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/14/48/315     Document Type: Article
Times cited : (13)

References (23)
  • 14
    • 0032482031 scopus 로고    scopus 로고
    • The prepration technique described in this article has been modified by P Schubert-Bischoff, Hahn-Meitner Insitut, Berlin
    • Zhang H 1998 Thin Solid Films 320 77-85 The prepration technique described in this article has been modified by P Schubert-Bischoff, Hahn-Meitner Insitut, Berlin
    • (1998) Thin Solid Films , vol.320 , pp. 77-85
    • Zhang, H.1
  • 20
    • 0041959759 scopus 로고    scopus 로고
    • Large-angle convergent-beam electron diffraction (LACBED): Application to crystal defects
    • Paris
    • Morniroli J P 2002 Large-angle convergent-beam electron diffraction (LACBED): application to crystal defects Monographs of the French Society of Microscopies Paris
    • (2002) Monographs of the French Society of Microscopies
    • Morniroli, J.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.