Wetting properties at the submicrometer scale: A scanning polarization force microscopy study

Journal of Physical Chemistry B

Volumn 102, Issue 20, 1998, Pages 3941-3944

  Rieutord, F ^a,b   Salmeron, M ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b CEA GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000173802     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp980149l     Document Type: Article

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