Scanning tunneling spectroscopy and ballistic electron emission microscopy studies of aluminum-oxide surfaces

Physical Review B - Condensed Matter and Materials Physics

Volumn 65, Issue 20, 2002, Pages 2014031-2014034

  Perrella, A C ^a   Rippard, W H ^a   Mather, P G ^a   Plisch, M J ^a   Buhrman, R A ^a  

^a School of Operations Research and Industrial Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM OXIDE;

ARTICLE; ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

EID: 0037095379     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)