Photo-carrier generation as the origin of Fowler-Nordheim-induced substrate hole current in this oxides

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1999, Pages 465-468

  Rasras, M ^a   De Wolf, I ^a   Groeseneken, G ^a   Kaczer, B ^a   Degraeve, R ^a   Maes, H E ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRON ENERGY LEVELS; GATES (TRANSISTOR); IMPACT IONIZATION; LIGHT EMISSION; MOSFET DEVICES; OXIDES; PHOTOCURRENTS; PHOTONS;

ANODE HOLE INJECTION; FOWLER-NORDHEIM INDUCED SUBSTRATE HOLE CURRENT; PHOTOCARRIER GENERATION;

ELECTRON TUNNELING;

EID: 0033347305     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)