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Physical Review B - Condensed Matter and Materials Physics

Volumn 65, Issue 8, 2002, Pages 813041-813044

Atomic diffusion at solid/liquid interface of silicon: Transition layer and defect formation

(5) Motooka, Teruaki a Nishihira, Ken a Oshima, Ryuichiro b Nishizawa, Hirosato b Hori, Fuminobu b

a KYUSHU UNIVERSITY (Japan)

b Osaka Prefecture University (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; ATOM; DIFFUSION; LIQUID; MOLECULAR DYNAMICS; PHASE TRANSITION; SOLID STATE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037084581 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.65.081304 Document Type: Article

Times cited : (24)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.