Low-temperature scanning near-field optical microscope for rapid measurement of thousands of absorption spectra

Journal of Applied Physics

Volumn 91, Issue 2, 2002, Pages 849-855

  Fukutake, Naoki ^a   Takasaka, Shigehiro ^a   Kobayashi, Takayosi ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORBING MATERIALS; ABSORPTION IMAGES; ACQUISITION TIME; J AGGREGATES; LOW TEMPERATURES; MULTICHANNEL DETECTORS; NEAR-FIELD; POLARIZATION DEPENDENCE; RAPID MEASUREMENT; SAMPLE SURFACE; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; THIN POLYMER FILMS; WHITE LIGHT SOURCES;

LIGHT SOURCES; MICROSCOPES; OPTICAL SYSTEMS; PIXELS; POLYMER FILMS; TUNGSTEN;

ABSORPTION SPECTRA;

EID: 0037080695     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1423390     Document Type: Article

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