The Comparative study on diamond film by near-field Raman spectroscopy and micro-Raman spectroscopy

Solid State Communications

Volumn 115, Issue 4, 2000, Pages 173-177

  Wang, Jingjing ^a   Yan, Hong ^a   Deng, Yujun ^a   Li, Hongdong ^a   Zhang, Yufeng ^a   Zhang, Fan ^a   Xia, Zongju ^a   Gao, Qiaojun ^a   Du, Weimin ^a   Zhou, Hetian ^a   Zou, Yinghua ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; FILM PREPARATION; OPTICAL MICROSCOPY; RAMAN SCATTERING; RAMAN SPECTROSCOPY; THIN FILMS;

HOT FILAMENT CHEMICAL VAPOR DEPOSITION (CVD); INELASTIC LIGHT SCATTERING; MICRO-RAMAN SPECTROSCOPY; NEAR FIELD RAMAN SPECTROSCOPY;

DIAMOND FILMS;

EID: 18844479892     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(00)00170-8     Document Type: Article

References (14)

1. Zhu X., Huang G.S., Zhou H.T., Dai Y.D., Ling Y., Gan Z.Z. Opt. Rev. 4:(1B):1997;236.
2. X. Zhu, Near Field Optics and Near Field Scanning Optical Microscopy, CCAST-WL Workshop Series, Vol. 64, 1996, p. 75.
3. Jahncke C.L., Paesler M.A., Hallen H.D. Appl. Phys. Lett. 67:1995;2483.
4. Jersch J., Demming F., Hildenhagen L.J., Dickmann K. Appl. Phys. A. 66:1998;29.
5. Grausem J., Humbert B., Spajer M., Courjon D., Burneau A., Oswalt J. J. Raman Spectrosc. 30:1999;833.
6. G. P. Collins, Physics Today, May 1994, p. 17.
7. Tsai D.P., Othonos A., Moskovits M., Uttamachandam D. Appl. Phys. Lett. 64:1994;1768.
8. Jahncke C.L., Hallen H.D., Paesler M.A. J. Raman Spectrosc. 27:1996;579.
9. Webster S., Batchelder D.N., Smith D.A. Appl. Phys. Lett. 72:1998;1478.
10. Goetz M., Drews D., Zahn D.R.T., Wannemacher R. J. Lumin. 76/77:1998;306.
11. Wang J.J., Yan H., Deng Y.J., Li H.D., Zhang Y.F., Zhang F., Xia Z.J., Gao Q.J., Zou Y.H. Chin. J. Raman Scattering. 4:2000;. (in press).
12. Gao Q.J., You L.P., Pan X.H., Zhang F., Peng X.F., Lin Z.D. Diamond Related Mater. 6:1997;1836.
13. Huong P.V. XVIth International Conference on Raman Spectroscopy. 1998;Wiley, New York. p. 488.
14. Marcus B., Fayette L., Mermoux M., Abello L., Lucazeau G. J. Appl. Phys. 76:1994;3463.