Computed depth profile method of X-ray diffraction and its application to Ni/Pd films

Surface and Coatings Technology

Volumn 149, Issue 2-3, 2002, Pages 198-205

  Wu, Huaqiang ^a   Li, Bin ^a   Miao, Wei ^a   Liu, Xingtao ^a   Tao, Kun ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Depth profiling; Ni Pd thin film; X ray diffraction

Indexed keywords

ALGORITHMS; CRYSTALLOGRAPHY; DIFFRACTION; INVERSE PROBLEMS; LEAST SQUARES APPROXIMATIONS; TEXTURES; X RAY DIFFRACTION ANALYSIS;

NON-NEGATIVE LEAST SQUARE (NNLS) ALGORITHMS;

THIN FILMS;

ALGORITHM; FILM; NICKEL; PALLADIUM; TEXTURE; TOMOGRAPHY; X-RAY TECHNIQUE;

EID: 0037080538     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(01)01442-6     Document Type: Article

References (12)