Direct structure depth profiling of polycrystalline thin films by X-ray diffraction and its application

Thin Solid Films

Volumn 353, Issue 1, 1999, Pages 56-61

  Li, Bin ^a   Tao, Kun ^a   Liu, Xingtao ^a   Miao, Wei ^a   Luo, Jian ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ANNEALING; AUGER ELECTRON SPECTROSCOPY; PALLADIUM; POLYCRYSTALLINE MATERIALS; SILVER; SURFACE STRUCTURE; X RAY DIFFRACTION ANALYSIS;

ABSORPTION COEFFICIENT; DIRECT STRUCTURE DEPTH PROFILING; X RAY INTENSITY SIMULATION METHOD;

THIN FILMS;

EID: 0033352051     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00384-3     Document Type: Article

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