X-ray diffraction study of concentration depth profiles of binary alloy coatings during thermal diffusion: Application to brass coating

Journal of Applied Crystallography

Volumn 32, Issue 1, 1999, Pages 27-35

  Bolle, B ^a   Tidu, A ^a   Heizmann, J J ^a  

^a UNIVERSITÉ PAUL VERLAINE METZ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007952801     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889898009765     Document Type: Article

References (19)

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