Studies on nondestructive depth resolved XRD method

Powder Diffraction

Volumn 11, Issue 2, 1996, Pages 117-120

  Luo, Jian ^a   Du, Yong ^a   Tao, Kun ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DEPTH PROFILING; LAPLACE TRANSFORMS; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL TRANSFORMATIONS;

DEPTH DISTRIBUTION; FEASIBILITY TESTS; LAPLACE TRANSFORMATIONS; MODEL INDEPENDENT; NONLINEAR LEAST-SQUARES TECHNIQUES; PREFERRED ORIENTATIONS; QUANTITATIVE CHARACTERIZATION; STRUCTURAL INFORMATION;

INVERSE PROBLEMS;

EID: 0030553666     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/S0885715600009088     Document Type: Article

References (12)

1. C. Qiuzi, "Phase Analysis of Bulk Samples with Sample-Tilting X-ray Diffractometry," J. Appl. Crystallogr. 25, 582-588 (1992).
2. Q. Z. Cong, D. Y. Yu, L. J. Weng, and F. Q. Zhang, "X-ray Phase Analysis with Depth Profiling for Thin Film," Thin Solid Films 213, 13-18 (1992).
3. F. Pones, S. Megtert, J. C. Pinvin, M. Pequignot, D. Mairey, and C. Roques-Carmes, "Application of a Grazing Incidence X-ray Diffraction Technique to Depth-Resolved Analysis of Structural Transformations due to Surface Treatment," J. Appl. Crystallogr. 21, 197-205 (1988).
4. A. Van Riessen and B. H. O'connor, "Depth Profiling of Ceramic Specimens Using Multiwavelength X-ray Bragg-Brentano Data with Particular Zirconia Alumina," Adv. X-ray Anal. 35, 169 (1992).
5. M. F. Toney, T. C. Huang, S. Brennan, and Z. Rek, "X-ray Depth Profiling of Iron Oxide Thin Films," J. Mater. Res. 3(2), 351-356 (1988).
6. T. C. Huang, "Surface and Untra-thin Films Characterization by Grazing Incidence Asymmetric Bragg Diffraction," Adv. X-ray Anal. 33, 91-100 (1990).
7. P. Predecki, "Determination of Depth Profiles from X-ray Diffraction Data," Powder Diffraction 8(2), 122-126 (1993).
8. J. Luo, H. Yin, and K. Tao, "XRD Phase Depth Profiling of Polycrystal with Continuous Depth Phase Distribution," Acta Phys. Sin. (Chinese Edition) 44(11), 1788-92 (1995).
9. J. Luo and K. Tao, "Computer Depth Profiling Analysis Method of XRD Polycrystalline Patterns," Acta Phys. Sin. (Chinese Edition) 44(11), 1793-97 (1995).
10. J. Luo and K. Tao, "Quantitative X-ray Diffraction Analysis of Surface Layers by Computed Depth Profiling," Thin Solid Films (1996).
11. A. V. Tikhonov and A. V. Goncharsky, in Ill-posed Problem in Nature Sciences (MIR, Moscow, 1987).
12. S. X. Huang and J. Chen, "On a Regularization Method for Operator Equations of the First Kind and Application," J. Southeast Univ. (Chinese Edition) 23, 107 (1993).