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Materials Science and Engineering: A

Volumn 217-218, Issue , 1996, Pages 34-37

Local structure and chemical reaction of C60 films on Si(111)7 x 7 studied by HREELS-STM

(8) Suto, S a Kasuya, A b Hu, C W b Wawro, A b Sakamoto, K a Wakita, T a Goto, T a Nishina, Y b

a TOHOKU UNIVERSITY (Japan)

b TOHOKU UNIVERSITY (Japan)

Author keywords

C60; High resolution electron energy loss spectroscopy; Scanning tunneling microscopy; Silicon; Thin films

Indexed keywords

CHARGE TRANSFER; CHEMICAL BONDS; CHEMICAL REACTIONS; ELECTRON ENERGY LOSS SPECTROSCOPY; ESTIMATION; FULLERENES; HEATING; MOLECULAR ORIENTATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SURFACES; THERMODYNAMIC STABILITY;

HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY; LOCAL STRUCTURE;

THIN FILMS;

EID: 0030259229 PISSN: 09215093 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5093(96)10310-5 Document Type: Article

Times cited : (11)

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